Stresstech XStress Robot

XStress Robot system with robot goniometer makes residual stress or nondestructive texture measurements by X-ray diffraction easy and flexible on complicated parts, large and small.

YXLON FF35 Computer Tomograph

Dual beam supported metrology, tomography, 3D reconstruction with high resolution and extended sample geometry.

Thermo Scientific Helios G4 PFIB SEM

LA-PFIB extends the conventional SEM (imaging, EDS, EBSD) techniques to 3D in large volume. Possibility for micro-nano-fabrication.

Bruker D8 Discover XRD SAXS XRR

The ultimate multipurpose Xray diffractometer provides diffraction, reflectometry, or small angle scattering for structural characterization of powder, bulk, polycrystalline materials or multilayered thin film at ambient or elevated temperature.